" Who's Afraid of the Big-Bad VXIbus? ," Cal Lab , October 1994 .
" Registration or Accreditation ," Cal Lab , August 1994 .
" Boundary Scan and the Working Metrologist - II ," Cal Lab , July 1994 .
" Boundary Scan and the Working Metrologist ," Cal Lab , June 1994 .
" Arrested Metrication ," Cal Lab , May 1994 .
" Metrology in a Changing World ," Cal Lab , March 1994 .
" At Last.... ," Cal Lab , February 1994 .
" Support Your Local Cal Lab ," Test & Measurement World , September 1993 .
" Climbing Aboard the Green Machine ," Test & Measurement World , August 1993 .
" Torture Testing ," Test & Measurement World , July 1993 .
" Shutting the Motor Off ," Motorcycle Tour & Travel , June 1993 .
" Test & Measurement Europe! ," Test & Measurement World , June 1993 .
" Government Funded Civilian Research ," Test & Measurement World , May 1993 .
" Providing Value ," Test & Measurement World , April 1993 .
" The Golden Path to Quality ," Test & Measurement World , March 1993 .
" The Spirit of Adventure ," Motorcycle Tour & Travel , March 1993 .
" Getting ISOed ," Test & Measurement World , January 1993 .
" R&D Competitiveness ," Test & Measurement World , December 1992 .
" Inspection and the Future of Test ," Test & Measurement World , November 1992 .
" Benchmarking ATE ," Test & Measurement World , October 1992 .
" SPC Makes Testing Obsolete ," Test & Measurement World , September 1992 .
" Say 'Hello' to Martin ," Test & Measurement World , August 1992 .
" Keeping Up ," Test & Measurement World , July 1992 .
" It's Hype If ... ," Test & Measurement World , June 1992 .
" Six Sigma Testing ," Test & Measurement World , May 1992 .
" Shanghaied! ," Test & Measurement World , April 1992 .
" The First Law of Testing ," Test & Measurement World , March 1992 .
" Teaching Test Skills ," Test & Measurement World , August 1989 .
" When Digital Becomes Analog ," Test & Measurement World , December 1988 .
" Seeing the Future ," Test & Measurement World , November 1988 .
" An Insidious Plot ," Test & Measurement World , October 1988 .
" Coping With Technological Limits ," Test & Measurement World , September 1988 .
" How Good is Your Information ," Test & Measurement World , August 1988 .
" The Quest For Quality ," Test & Measurement World , June 1988 .
" Headaches and Challenges ," Test & Measurement World , May 1988 .
" 'Less is More' and Other Fiction ," Test & Measurement World , April 1988 .
" Why We Do What We Do ," Test & Measurement World , March 1988 .
" Leaping Ahead ," Test & Measurement World , February 1988 .
" The Human Race Includes a Random Walk ," Test & Measurement World , January 1988 .
" Looking Back and Looking Ahead ," Test & Measurement World , December 1987 .
" Making the Spectrometer Fit the Need ," R&D , February 2001 .
" Easing Into Molecule Analysis ," R&D , February 2001 .
" Government Lab Expands its Experimental Reign ," R&D , December 2000 .
" Innovation Makes Sensors Smarter and More Networked ," R&D , December 2000 .
" Test Drive a Microscope ," Test & Measurement World , November 2000 .
" Data Mining Can Tame Mountains of Information ," R&D , November 2000 .
" Data Mining Can Tame Mountains of Information ," R&D , November 2000 .
" Key Microscope Specs Guide Buying Decisions ," Test & Measurement World , October 2000 .
" Implanter Technology Grows Up ," R&D , October 2000 .
" Proper Lighting Gets the Most from Microscope Images ," Test & Measurement World , September 2000 .
" Going Beyond Copper Interconnects ," R&D , July 2000 .
" Light Characteristics Limit Optical Quality ," Test & Measurement World , June 2000 .
" Basic Optical Effects Limit Image Quality ," Test & Measurement World , May 2000 .
" Microscopes Rely on Basic Optical Components ," Test & Measurement World , April 2000 .
" Old Microscopes Learn New Tricks ," Test & Measurement World , January 2000 .
" Environmental Testing Gets Practical ," Quality & R&D , August 1999 .
" Two Instrument Interface Standards Target Similar Goals ," R&D , May 1999 .
" Software Smartens Up Data Manipulation ," IEEE Spectrum , April 1999 .
" How To Build a Data Acquisition System in 4 Steps ," R&D , March 1999 .
" Technology 1999 Analysis & Forecast: Test & Measurement ," IEEE Spectrum , January 1999 .
" Analysis Software Shapes Data Into Useable Results ," R&D , January 1999 .
" UV Microscopes Inspect Submicron Features ," Test & Measurement World , December 1998 .
" The Future of Computerized Data-Gathering Instrumentation ," R&D , December 1998 .
" Scatterometry Is Key to Advanced Thin-Film Processing ," R&D , December 1998 .
" Internet Access Expands Reach of Data Acquisition ," R&D , November 1998 .
" Smart Instruments Make Doctors' Jobs Easier ," R&D , August 1998 .
" Metrology Blazes the Trail To Smaller Semiconductors ," R&D , July 1998 .
" Automated Instruments Are Becoming 'Smarter' ," R&D , June 1998 .
" Lighting Makes Its Mark on Vision Systems ," Test & Measurement World , May 1998 .
" Mixed Protocols Intrinsic to DAQ Applications ," R&D , May 1998 .
" Moisture Analysis Crucial to Success ," R&D , April 1998 .
" Automotive Testing Demands Dedicated DAQ ," R&D , March 1998 .
" SPMs Tackle Manufacturing Inspection Tasks ," Test & Measurement World , March 1998 .
" Particle Analyzers Keep Processes in Control ," R&D , February 1998 .
" LCs and GCs Performing Dual Roles in Industry ," R&D , January 1998 .
" Test & Measurement 1998 Technology Analysis & Forecast ," IEEE Spectrum , January 1998 .
" Turbocharging IEEE-488 ," R&D , December 1997 .
" Smart Equipment Tells Where It Hurts ," R&D , November 1997 .
" Alphabet Soup and Temperature Measurement ," R&D , October 1997 .
" Data Recording's Greatest Hits ," R&D , August 1997 .
" Developing an Interactive Television System That Works ," R&D , June 1997 .
" Developing an Interactive Television System that Works ," R&D , June 1997 .
" Power Supply Research Ensures Telecom's Reliability ," R&D , June 1997 .
" Power Supply Research Ensures Telecom's Reliability ," R&D , June 1997 .
" High Tech on the Highway ," R&D , April 1997 .
" Scanning Probe Microscopy Earns Its Keep in Industry ," R&D , March 1997 .
" Remote Monitoring ," R&D , February 1997 .
" Jet-Engine Tests Simulate Real-World Hazards ," R&D , January 1997 .
" Spectroscopic Techniques Peer Into Combustion-Chamber Chemistry ," R&D , December 1996 .
" Putting 'Quiet Shoes' on Household Appliances ," R&D , November 1996 .
" Automating Sensors for the Global Data Set ," R&D , October 1996 .
" Testing Cars an Exact Science ," R&D , March 1996 .
" Image-Archiving Software Saves the Big Picture for Posterity ," R&D , February 1996 .
" GPS Plugging into the Space-Time Grid ," R&D , January 1996 .
" Re-Engineering Engineering Education ," IEEE Spectrum , September 1995 .
" R&D100 Winner Makes Quick Work of Thin-Film Characterization ," R&D , November 1994 .
" How Board Testers are Changing in the '90s ," Electronic Business Buyer , October 1994 .
" How to Win Big in a Stagnant Market ," Electronic Business Buyer , October 1994 .
" Automated Inspection Boosts PCB Quality ," Test & Measurement World , August 1994 .
" Automated Inspection Boosts PCB Quality ," Test & Measurement World , August 1994 .
" Find (and Stop) That Spill! ," R&D , August 1994 .
" Henry Sostmann Receives 1994 Wildhack Award ," Cal Lab , August 1994 .
" Large Object Calibration Service Started ," Cal Lab , August 1994 .
" Oak Ridge Y-12 Plant ," Cal Lab , August 1994 .
" Calibration Lab Accreditation Program Starts Up ," Cal Lab , July 1994 .
" Measuring Complex Signals with Digital Scopes and AWGs ," R&D , June 1994 .
" Computers Boost Productivity of Universal Test Machines ," R&D , May 1994 .
" Increasing Materials Testing Productivity Through Computerization ," R&D , May 1994 .
" DSOs and AWGS: Source and Measure for Complex Signals ," R&D , April 1994 .
" Probe-Point Cutting Makes IC Backtracing Practical ," EDN Products Edition , March 1994 .
" GenRad Repositions for Growth ," Electronic Business Buyer , February 1994 .
" Process Controllers Keep Experiments on Track ," R&D , February 1994 .
" Benchtop Power Supplies and How to Find Them ," R&D , January 1994 .
" Choosing the Right Benchtop Power Supply ," R&D , January 1994 .
" GenRad Chief Angered by Mismanagement ," Electronic Business Buyer , January 1994 .
" New Options for Data Capture ," R&D , December 1993 .
" Schlumberger Climbs Back to the Top ," Electronic Business Buyer , December 1993 .
" Advantest America Builds for the Future ," Electronic Business Buyer , November 1993 .
" Sniffing Out Toxic Gas Leaks ," R&D , November 1993 .
" Hyperion Gets a New Life ," Electronic Business Buyer , October 1993 .
" Structured Programming in BASIC ," Test & Measurement World , October 1993 .
" Fisherman's Wharf, San Francisco ," Motorcycle Tour & Travel , June 1993 .
" Shelburne Falls, Massachusetts ," Motorcycle Tour & Travel , June 1993 .
" 1993 FLHTC Ultra Classic Electra Glide ," Motorcycle Tour & Travel , March 1993 .
" Baltimore's Inner Harbor ," Motorcycle Tour & Travel , March 1993 .
" Choosing the Right Helmet ," Motorcycle Tour & Travel , March 1993 .
" Interferometric OTDRS ," Test & Measurement World , October 1992 .
" Measuring Polarization Dispersion ," Test & Measurement World , October 1992 .
" What Is Your Draw Tension ," Test & Measurement World , October 1992 .
" A Bridge from Design to Inspection! ," Test & Measurement World , September 1992 .
" Design for Inspectability ," Test & Measurement World , July 1992 .
" OTDR Selection Criteria ," Test & Measurement World , July 1992 .
" Arizona Heat ," American Iron Magazine , May 1992 .
" EMP Simulation with an AWG ," Test & Measurement World , May 1992 .
" Fun with S - Parameters ," Test & Measurement World , May 1992 .
" Selecting an Optical Microscope ," Test & Measurement World , February 1992 .
" Testing VLSI Devices in the 1990's: Part of a New Way to Do Business ," Keynote speech at 1991 VLSI Testing Conference , April 1991 .
" In Search of Laser Diode Tests - Part 2 ," Test & Measurement World , August 1990 .
" Scanning Tunneling Microscopy: A Basic Exploration ," Microscope Technology and News , July 1990 .
" In Search of Laser Diode Tests - Part 1 ," Test & Measurement World , June 1990 .
" Live Depth Perception for SEMS ," Test & Measurement World , June 1990 .
" Specifying Satisfaction ," AMP Designer Digest , June 1990 .
" Pick Yourself an SEM ," Test & Measurement World , May 1990 .
" An STM for Submicron Metrology ," Test & Measurement World , April 1990 .
" Maintaining Fiber Test Equipment Becomes Top Priority ," Test & Measurement World , April 1990 .
" Selecting an Optical Microscope and Getting Your Money's Worth ," Microscope Technology and News , April 1990 .
" Assemble Your Own Imaging System ," Test & Measurement World , March 1990 .
" Group Delay Dispersion Measurements in Optical Amplifiers ," Test & Measurement World , March 1990 .
" So ... You Want to Measure Submicron Dimensions ," Test & Measurement World , March 1990 .
" Correcting Power Measurements for Connector Loss ," Test & Measurement World , February 1990 .
" How Digital Scopes Do Signal Analysis ," Test & Measurement World , February 1990 .
" Microbending Loss Measurements Require Random-Bend Fixtures ," Test & Measurement World , February 1990 .
" Imaging with Icons ," Test & Measurement World , December 1989 .
" Measuring Mode Coupling In Polarization-Maintaining Fibers ," Test & Measurement World , December 1989 .
" Ion Beam Inspects and Modifies ICs ," Test & Measurement World , November 1989 .
" AOI System Verifies DIP Markings ," Test & Measurement World , September 1989 .
" Detection Methods Show Superiority for Different Fiber Lengths ," Test & Measurement World , September 1989 .
" Optical Microscopes in Semiconductor Inspection ," Test & Measurement World , August 1989 .
" Advanced Techniques Inspect Advanced Products ," Test & Measurement World , October 1988 .
" Choosing a Digital Oscilloscope ," Test & Measurement World , October 1988 .
" How Digital Scopes Sample ," Test & Measurement World , October 1988 .
" The Right Way to Use Image Analyzers ," Test & Measurement World , September 1988 .
" Selecting an optical Microscope ," Test & Measurement World , August 1988 .
" What Can Thermal Imaging Do For You? ," Test & Measurement World , May 1988 .
" Using Attenuators to Test High-Power Lasers ," Test & Measurement World , April 1988 .
" What Capacitance is This Capacitor?"with B.J. Thompson ," Test & Measurement World , February 1988 .
" Planning OTDR PurchaBeB ," Test & Measurement World , January 1988 .
" Electronic Inspection in the Early 1990s ," Test & Measurement World , December 1987 .
" Electro-optics Testing in the Next Decade ," Test & Measurement World , December 1987 .
" Solutions to Current Problems in ATE Fixturing ," Test & Measurement World , December 1987 .
" Magnetic Resonance Imaging Using Permanent Magnets ," Proceedings of Application of Optical Instrumentation in Medicine XI , June 1983 .
" Lodestone' Technology Comes to NMR Imaging ," Diagnostic Imaging , April 1983 .
" Temperature Control of a Tungsten Incandescent Lamp ," Review of Scientific instruments , February 1979 .
" Guide to Handheld Multimeters ," R&D , January 1996 .
" Viscometry Goes from Stone Knives to High Tech ," R&D , December 1995 .
175 Articles Listed